Title/Place of Publication
Publication ID
17261
Date Created
2010.08.09 19:19
DOI
10.1088/1742-6596/83/1/012004
Open Access URL
English Title
Using Anomalous Dispersion Effect for Maximum Entropy Method Analysis of X-ray Reflectivity from Thin-Film Stacks
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Physics: Conference Series
Vol.
83
No.
Year of Publication
2007
Page
012004
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
[A10] Life Science
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0005099
Ueda
Kazuhiro
Hitachi, Ltd.
Related Proposal Information
Proposal Number
2006A5090
Beamline
BL16XU
Project Leader
上田 和浩
Proposal Number
2006B5090
Beamline
BL16XU
Project Leader
上田 和浩