Title/Place of Publication
145
2007.01.30 10:55
Analysis of Ordered Structure of Buried Oxide Layers in Simox Wafers
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices
99-3 1999 155-160
Ninth International Symposium on Silicon-on-Insulator Technology and Devices
1999.05.02-05.07 Seattle, USA
Authors
 
First Author 0001281 Shimura Takayoshi Osaka University
Coauthor 1 0004419 Hosoi Takuji Osaka University
Coauthor 2 0005066 Umeno Masataka Osaka University
Related Proposal Information
1999A0024 BL09XU 志村 考功