Title/Place of Publication
14458
2009.07.17 11:21
10.1143/APEX.2.085501
In situ Real-time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Applied Physics Express
2 8 2009 085501
Authors
 
First Author 0016163 Sasaki Takuo Toyota Technological Institute
Coauthor 1 0016208 Suzuki Hidetoshi Toyota Technological Institute
Coauthor 2 0024182 Sai Akihisa Toyota Technological Institute
Coauthor 3 0024172 Lee Jong-Han Toyota Technological Institute
Coauthor 4 0001168 Takahashi Masamitsu JAEA
Coauthor 5 0004806 Fujikawa Seiji JAEA
Coauthor 6 0016168 Arafune Koji University of Hyogo
Coauthor 7 0005744 Kamiya Itaru Toyota Technological Institute
Coauthor 8 0014251 Ohshita Yoshio Toyota Technological Institute
Coauthor 9 0023399 Yamaguchi Masafumi Toyota Technological Institute
Related Proposal Information
2008B3571 BL11XU 山口 真史