Title/Place of Publication
Publication ID
13745
Date Created
2009.02.26 11:41
DOI
10.1007/s10854-008-9641-1
Open Access URL
English Title
Characterization of Strained Si Wafers by X-ray Diffraction Techniques
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Materials Science: Materials in Electronics
Vol.
19
No.
Supplement 1
Year of Publication
2008
Page
S189-S193
Place of Publication (Oral, Poster)
Conference Title
International Conference on Defects-Recognition, Imaging and Physics in Semiconductors
Date
2007.09.09-09.13
Venue
Berlin, Germany
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001281
Shimura
Takayoshi
Osaka University
Coauthor 1
0016745
Kawamura
Kouta
Osaka University
Coauthor 2
0018764
Asakawa
Masahiro
Osaka University
Coauthor 3
0020707
Watanabe
Heiji
Osaka University
Coauthor 4
Yasutake
Kiyoshi
Osaka University
Coauthor 5
0015928
Ogura
Atsushi
Meiji University
Coauthor 6
0006085
Fukuda
Kazunori
SPring-8/JASRI
Coauthor 7
0003369
Sakata
Osami
SPring-8/JASRI
Coauthor 8
0004124
Kimura
Shigeru
SPring-8/JASRI
Coauthor 9
0020260
Edo
Hiroki
Toyama University
Coauthor 10
0001768
Iida
Satoshi
Toyama University
Coauthor 11
0005066
Umeno
Masataka
Fukui University of Technology
Related Proposal Information
Proposal Number
2006B1759
Beamline
BL13XU
Project Leader
福田 一徳
Proposal Number
2007A2029
Beamline
BL13XU
Project Leader
志村 考功
Proposal Number
2007A1736
Beamline
BL20B2
Project Leader
志村 考功
Proposal Number
2007B1557
Beamline
BL20B2
Project Leader
志村 考功