Title/Place of Publication
13547
2009.01.14 14:59
Beyond the Abilities of Rietveld Analysis: MEM-based Pattern Fitting with Synchrotron X-ray Powder Diffraction Data
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Commission on Powder Diffraction, IUCr Newsletter
26 2001 7-9
Authors
 
First Author 0007532 Izumi Fujio National Institute for Materials Science
Coauthor 1 0005939 Ikeda Takuji National Institute for Materials Science
Related Proposal Information
C01B2003 BL15XU 池田 拓史