Title/Place of Publication
13063
2008.10.18 13:02
Structural Study on Interface between Thick Gallium Layer and SiC Substrate by X-ray Reflectivity under Transmission Geometry
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Transactions of the Materials Research Society of Japan
33 3 2008 557-560
Authors
 
First Author 0014633 Noda Takehiro Kwansei Gakuin University
Coauthor 1 0017358 Tanaka Masanori Kwansei Gakuin University
Coauthor 2 0007338 Kitahara Amane Kobelco Research Institute, Inc.
Coauthor 3 0014256 Kaneko Tadaaki Kwansei Gakuin University
Coauthor 4 0003369 Sakata Osami SPring-8/JASRI
Coauthor 5 0003142 Takahashi Isao Kwansei Gakuin University
Related Proposal Information
2004A0076 BL13XU 高橋 功
2004B0115 BL13XU 高橋 功