Title/Place of Publication
13056
2008.10.15 10:26
Grazing Incidence Small Angle X-ray Scattering Study for Determining Structure and Composition of Multi-Stack Ge Nanowires on Si(113)
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Transactions of the Materials Research Society of Japan
33 3 2008 535-539
Authors
 
First Author 0003923 Omote Kazuhiko Rigaku Corporation
Coauthor 1 0006299 Omi Hiroo NTT Corporation
Coauthor 2 0003394 Kawamura Tomoaki NTT Corporation
Related Proposal Information
2006A1325 BL13XU 表 和彦