Title/Place of Publication
Publication ID
12098
Date Created
2008.02.04 20:52
DOI
10.1088/1742-6596/83/1/012009
Open Access URL
English Title
Oxidation Process Dependence of Strain Field under the SiO
2
/Si(001) Interface Revealed by X-ray Multiple-wave Diffraction
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Physics: Conference Series
Vol.
83
No.
Year of Publication
2007
Page
012009
Place of Publication (Oral, Poster)
Conference Title
埋もれた界面のＸ線・中性子線解析に関するワークショップ 2007 (’Buried’ Interface Science with X-rays and Neutrons 2007)
Date
2007.07.22-07.24
Venue
Sendai, Japan
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0003297
Yashiro
Wataru
The University of Tokyo
Coauthor 1
0001245
Yoda
Yoshitaka
SPring-8/JASRI
Coauthor 2
0008044
Takahashi
Kensuke
Musashi Institute of Technology
Coauthor 3
0015559
Yamamoto
Masashi
Tohoku University
Coauthor 4
0007880
Hattori
Takeo
Tohoku University
Coauthor 5
0004138
Miki
Kazushi
National Institute for Materials Science
Related Proposal Information
Proposal Number
2006A1492
Beamline
BL09XU
Project Leader
矢代 航
Proposal Number
2005B0483
Beamline
BL09XU
Project Leader
矢代 航
Proposal Number
2005A0635
Beamline
BL09XU
Project Leader
矢代 航