Title/Place of Publication
Publication ID
11930
Date Created
2008.01.04 18:16
DOI
10.1149/1.2728797
Open Access URL
English Title
Bias Temperature Instability Characterization of Advanced Gate Stacks
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
ECS Transactions
Vol.
6
No.
3
Year of Publication
2007
Page
185-202
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
Fujieda
Shinji
NEC Corporation
Coauthor 1
Terai
Masayuki
NEC Corporation
Coauthor 2
Saitoh
Motofumi
NEC Corporation
Coauthor 3
Toda
Akio
NEC Corporation
Coauthor 4
Miura
Yoshinao
NEC Corporation
Coauthor 5
Liu
Ziyuan
NEC Corporation
Coauthor 6
0000390
Teraoka
Yuden
JAEA
Coauthor 7
0001305
Yoshigoe
Akitaka
JAEA
Coauthor 8
0004404
Wilde
Markus
The University of Tokyo
Coauthor 9
0003164
Fukutani
Katsuyuki
The University of Tokyo
Related Proposal Information
Proposal Number
2005B3803
Beamline
BL23SU
Project Leader
寺岡 有殿