Title/Place of Publication
Publication ID
10719
Date Created
2007.03.03 14:40
DOI
10.1063/1.2436359
Open Access URL
English Title
Dislocation Elimination in Czochralski Silicon Crystal Growth Revealed by White X-ray Topography Combined with Topo-tomographic Technique
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
AIP Conference Proceedings
Vol.
879
No.
Year of Publication
2007
Page
1545-1549
Place of Publication (Oral, Poster)
Conference Title
International Conference on Synchrotron Radiation Instrumentation (SRI)
Date
2006.05.28-06.02
Venue
Daegu, Korea
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0003776
Kawado
Seiji
Rigaku Corporation
Coauthor 1
0001768
Iida
Satoshi
Toyama University
Coauthor 2
0001794
Kajiwara
Kentaro
SPring-8/JASRI
Coauthor 3
0001776
Suzuki
Yoshifumi
Kyushu Institute of Technology
Coauthor 4
0001769
Chikaura
Yoshinori
Kyushu Institute of Technology
Related Proposal Information
Proposal Number
2004B0532
Beamline
BL28B2
Project Leader
川戸 清爾