Title/Place of Publication
Publication ID
10447
Date Created
2007.01.30 10:57
DOI
10.1063/1.2436366
Open Access URL
English Title
Characterization of Amorphous High-k Thin Films by EXAFS and GIXS
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
AIP Conference Proceedings
Vol.
879
No.
Year of Publication
2007
Page
1573-1576
Place of Publication (Oral, Poster)
Conference Title
International Conference on Synchrotron Radiation Instrumentation (SRI)
Date
2006.05.28-06.02
Venue
Daegu, Korea
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0003152
Takemura
Momoko
Toshiba Corporation
Coauthor 1
0008496
Yamazaki
Hideyuki
Toshiba Corporation
Coauthor 2
0004894
Ohmori
Hirobumi
Toshiba Corporation
Coauthor 3
0004423
Yoshiki
Masahiko
Toshiba Corporation
Coauthor 4
0015222
Takeno
Shiro
Toshiba Corporation
Coauthor 5
Ino
Tsunehiro
Toshiba Corporation
Coauthor 6
Nishiyama
Akira
Toshiba Corporation
Coauthor 7
0015207
Satou
Nobutaka
Toshiba Nanoanalysis Corporation
Coauthor 8
0002088
Hirosawa
Ichiro
SPring-8/JASRI
Coauthor 9
0002072
Sato
Masugu
SPring-8/JASRI
Related Proposal Information
Proposal Number
C03B4012
Beamline
BL16B2
Project Leader
竹村 モモ子
Proposal Number
C04A4060
Beamline
BL16B2
Project Leader
竹村 モモ子
Proposal Number
2004B0493
Beamline
BL46XU
Project Leader
竹村 モモ子