Title/Place of Publication
10244
2007.01.30 10:57
10.1142/S0129156406003680
Study on the Gate Insulator/Silicon Interface Utilizing Soft and Hard X-ray Photoelectron Spectroscopy at SPring-8
Refereed Journals, Doctoral Thesis, Refereed Proceedings
International Journal of High Speed Electronics and Systems
16 1 2006 353-364
Authors
 
First Author 0007880 Hattori Takeo Musashi Institute of Technology, Tohoku University
Coauthor 1 0008035 Nohira Hiroshi Musashi Institute of Technology, SPring-8/JASRI
Coauthor 2 0013310 Azuma Kazufumi Musashi Advances LCD Technologies Development Center Co., Ltd.
Coauthor 3 Sakai Wataru Kyoto University
Coauthor 4 Nakajima Kaoru Kyoto University
Coauthor 5 Suzuki Motofumi Kyoto University
Coauthor 6 0017868 Kimura Kenji SPring-8/JASRI
Coauthor 7 Sugita Yoshihiro Fujitsu Laboratories, Ltd.
Coauthor 8 0000448 Ikenaga Eiji SPring-8/JASRI
Coauthor 9 0001835 Kobayashi Keisuke SPring-8/JASRI
Coauthor 10 0001866 Takata Yasutaka SPring-8/RIKEN
Coauthor 11 0015225 Kondo Hiroki SPring-8/JASRI
Coauthor 12 0015932 Zaima Shigeaki SPring-8/JASRI
Related Proposal Information
None BL29XU SPring-8 Experiment
2002A0199 BL27SU 服部 健雄