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10100 |
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2007.01.30 10:57 |
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10.11470/oubutsu.75.9_1140 |
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https://doi.org/10.11470/oubutsu.75.9_1140 |
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Growth and Dislocation-Structural Analysis of Ultrahigh-Quality Silicon Carbide Single Crystals |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
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応用物理 (Journal of Applied Physics, Japan)
75
9
2006
1140-1143
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