Title/Place of Publication
10046
2007.01.30 10:57
10.1016/j.vacuum.2005.11.033
Alteration of Internal Stresses in SiO2/Cu/TiN Thin Films by X-ray and Synchrotron Radiation Due to Heat Treatment
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Vacuum
80 7 2006 836-839
Authors
 
First Author 0008092 Matsue Tatsuya Niihama National College of Technology
Coauthor 1 0008084 Hanabusa Takao Tokushima University
Coauthor 2 Ikeuchi Yasukazu Niihama National College of Technology
Coauthor 3 0008085 Kusaka Kazuya Tokushima University
Coauthor 4 0003369 Sakata Osami SPring-8/JASRI
Related Proposal Information
2004A0277 BL13XU 日下 一也